Multicomponent semiconductor material discovery guided by a generalized correlated function expansion

Journal of Chemical Physics

Volumn 111, Issue 23, 1999, Pages 10640-10651

  Rabitz, Herschel ^a   Shim, Kyurhee ^a,b  

^a PRINCETON UNIVERSITY   (United States)

^b Kyonggi University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009107388     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.480417     Document Type: Article

References (28)

1. K. Iga and S. Kinoshita, Process Technology for Semiconductor Lasers (Springer, Berlin, 1996).
2. M. Quillec, Materials for Optoelectronics (Kluwer Academic, Boston, 1996).
3. P. S. Dutta, H. L. Bhat, and V. Kumar, J. Appl. Phys. 81, 5821 (1997).
4. S. Tanaka, K. Hiramatsu, Y. Habu, N. Sawaki, and I. Akasaki, J. Cryst. Growth 79, 978 (1986).
5. B. I. Miller, J. H. McFee, R. J. Martin, and P. K. Tien, Appl. Phys. Lett. 33, 44 (1978).
6. M. M. Panish and H. Temkin, Gas Source Molecular Beam Epitaxy, Springer Series in Material Science (Springer, Berlin, Heidelberg, 1993), Vol. 26.
7. S. Kaneiwa, H. Takiguchi, T. Hayakawa, S. Yamamoto, H. Hayashi, S. Yano, and T. Hijikata, Appl. Phys. Lett. 46, 455 (1985).
8. K. Shim and H. Rabitz, Phys. Rev. B 58, 1940 (1998).
9. K. Shim and H. Rabitz, Phys. Rev. B 57, 12874 (1998).
10. H. Rabitz, O. Alis, J. Shorter, and K. Shim, Comput. Phys. Commun. 115, 1 (1998).
11. T. L. Hill, Statistical Mechanics (McGraw-Hill, New York, 1956).
12. W. J. Gordon, in Proceedings of the Symposium on Approximation with Special Emphasis on Spline Functions, edited by I. J. Schoenberg (Academic, New York, 1969), pp. 223-277.
13. J. Ellman, J. Am. Chem. Soc. 114, 10997 (1992).
14. E. Pennisi, Science 278, 2056 (1997).
15. R. F. Service, Science 277, 474 (1997); X. D. Xing et al., ibid. 268, 1738 (1995).
16. R. F. Service, Science 277, 474 (1997); X. D. Xing et al., ibid. 268, 1738 (1995).
17. I. Sobol, Math. Comput. Exp. 1, 407 (1993).
18. K. Shim and H. Rabitz, J. Appl. Phys. 85, 7705 (1999).
19. A. I. Khuri and J. A. Cornell, Response Surfaces: Design and Analysis (Marcel Dekker, New York, 1996).
20. Numerical Data and Functional Relationships in Science and Technology: Semiconductor, edited by O. Madelung, M. Schulz, and H. Weiss (Springer, Berlin, 1982), Vol. 17. The experimental data and parameters are found on pp. 333-348, and the corresponding experimental fitting curves are shown in Figs. 57, 73, 91, 92, 116, 136, 144, and 159 in Sec. 2.16.
21. E. K. Muller and J. L. Richards, J. Appl. Phys. 35, 1233 (1964).
22. L. Vegard, Z. Phys. 5, 17 (1921).
23. J. M. Baranowski, J. Phys. C 17, 6287 (1984).
24. K. Nakajima, A. Yamaguchi, K. Akita, and T. Kotani, J. Appl. Phys. 49, 5944 (1978).
25. H. Nagai and Y. Noguchi, Digest of 1977 International Conference on Integrated Optics and Optical Fiber Communications (Tokyo, 1977), p. 201.
26. E. O. Gobal, GaInAsP Alloy Semiconductors, edited by T. P. Pearsall (Wiley, Chichester, 1982), p. 295.
27. P. M. Laufer, F. H. Pollack, R. E. Nahory, and M. A. Pollack, Solid State Commun. 36, 419 (1980).
28. A. E. Bocharev et al., Sov. Phys. Crystallogr. 34, 101 (1989).