Scattering of evanescent light by a finite-size probe in near-field scanning optical microscopy

Journal of Applied Physics

Volumn 80, Issue 9, 1996, Pages 4799-4803

  Fukuzawa, Kenji ^a   Kuwano, Hiroki ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009094279     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363519     Document Type: Article

References (18)

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