Is product screen enough to guarantee low failure rate for the customer?

IEEE International Reliability Physics Symposium Proceedings

Volumn 2001-January, Issue , 2001, Pages 12-16

  Ruprecht, M W ^a   La Rosa, G ^b   Filippi, R G ^b  

^a INFINEON TECHNOLOGIES   (United States)

^b IBM MICROELECTRONICS   (United States)

Author keywords

Acceleration; CMOS process; CMOS technology; Condition monitoring; Implants; MOSFET circuits; Process control; Stress; Testing; Voltage

Indexed keywords

ACCELERATION; CMOS INTEGRATED CIRCUITS; CONDITION MONITORING; DAMAGE DETECTION; DEFECTS; DENTAL PROSTHESES; ELECTRIC POTENTIAL; PROCESS CONTROL; STRESSES; TESTING;

CMOS PROCESSS; CMOS TECHNOLOGY; HOT CARRIER DAMAGES; MOSFET CIRCUITS; PRODUCT MONITORING; SCREENING STRATEGY; SUB-MICRON CMOS TECHNOLOGY; TECHNOLOGY LIMITATIONS;

MOSFET DEVICES;

EID: 0008993509     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2001.922874     Document Type: Conference Paper

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