Rutherford backscattering/channelling, XRD, XRD pole figure and AES characterization of FeTiO3 thin films prepared in different ambients by laser ablation

Journal of Physics Condensed Matter

Volumn 11, Issue 3, 1999, Pages 913-925

  Dai, Z ^a   Naramoto, H ^a   Yamamoto, S ^b   Narumi, K ^a   Miyashita, A ^b  

^a Japan Atomic Energy Research Institute   (Japan)

^b NONE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008955385     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/11/3/029     Document Type: Article

References (19)

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