Adsorption of N2H4on silicon surfaces

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 15, Issue 3, 1997, Pages 1155-1158

  Tindall, C ^a   Li, L ^a   Takaoka, O ^a   Hasegawa, Y ^a   Sakurai, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING TUNNELING MICROSCOPY (STM); SI (1 1 1); SI(1 0 0); SILICON SURFACES; STM IMAGES;

ADATOMS; ADSORPTION; DIMERS; SCANNING TUNNELING MICROSCOPY;

SILICON;

EID: 0008640328     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580446     Document Type: Article

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