Fringe formation in an in-plane displacement measurement configuration with twofold increase in sensitivity: Theory and experiment

Applied Optics

Volumn 37, Issue 19, 1998, Pages 4150-4153

  Santhanakrishnan, T ^a   Palanisamy, P K ^a   Sirohi, R S ^b  

^a ANNA UNIVERSITY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008577414     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.004150     Document Type: Article

References (8)

1. R. S. Sirohi and N. Krishna Mohan, “In-plane displacement measurement configuration with twofold sensitivity, ” Appl. Opt. 32, 6387-6390 (1993).
2. J. A. Leendertz, “Interferometric displacement measurement on scattering surface utilizing speckle effect, ” J. Phys. E 3, 214-218 (1970).
3. D. E. Duffy, “Moire gauging of in-plane displacement using double aperture imaging, ” Appl. Opt. 11, 1778-1781 (1972).
4. A. Sohmer and C. Joenathan, “Twofold increase in sensitivity with a dual-beam illumination arrangement for electronic speckle pattern interferometry, ” Opt. Eng. 35, 1943-1948 (1996).
5. N. Krishna Mohan, T. Santhanakrishnan, P. Senthilkumaran, and R. S. Sirohi, “Simultaneous implementation of Leendertz and Duffy’s methods for in-plane displacement measurement, ” Opt. Commun. 124, 235-239 (1996).
6. R. S. Sirohi and N. Krishna Mohan, “Role of lens aperturing in speckle metrology, ” J. Sci. Indust. Res. (India) 54, 67-74 (1995).
7. P. K. Rastogi, “Techniques of displacement and deformation measurements in speckle metrology, ”;
8. R. S. Sirohi, “Speckle methods in experimental mechanics, ” in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993).