Simple method for determining slowly varying refractive-index profiles from in situ spectrophotometric measurements

Applied Optics

Volumn 37, Issue 19, 1998, Pages 4160-4167

  Poitras, Daniel ^a   Martinu, Ludvic ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008366251     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.004160     Document Type: Article

References (13)

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