Multifractal analysis of the spatial distribution of the film surfaces with different roughening mechanisms

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 58, Issue 2, 1998, Pages 2213-2216

  Hou, J G ^a   Yan, Wang ^a   Rui, Xia ^a   Xiaoguang, Zhu ^b   Haiqian, Wang ^a   Wu, Z Q ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008303961     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.58.2213     Document Type: Article

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