High resolution imaging for charged particles using CR-39 and atomic force microscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 422, Issue 1-3, 1999, Pages 751-755

  Takahashi, H ^a   Amemiya, K ^a   Kaizuka, Y ^a   Nakazawa, M ^a   Yasuda, N ^b   Yamamoto, M ^b   Sakai, T ^c   Kamiya, T ^c   Okada, S ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008301398     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01030-4     Document Type: Article

References (5)

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2. M. Drndic et al., Nucl. Instr. and Meth. B 93 (1994) 52.
3. K. Havancsak et al., Rad. Meas. 28 (1997) 65.
4. M. Yamamoto et al., Rad. Meas. 28 (1997) 227.
5. N. Yasuda et al., Nucl. Instr. and Meth. B 142 (1998) 111.