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Volumn 50, Issue 2, 1997, Pages 57-60

Principles of rapid testing and a look to the future

Author keywords

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Indexed keywords


EID: 0007943988     PISSN: 1364727X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1471-0307.1997.tb01736.x     Document Type: Article
Times cited : (6)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.