Strong, easy-to-manufacture, transition edge x-ray sensor

Applied Physics Letters

Volumn 77, Issue 25, 2000, Pages 4196-4198

  Tanaka, Keiichi ^a   Morooka, Toshimitsu ^a   Chinone, Kazuo ^a   Ukibe, Masahiro ^b   Hirayama, Fuminori ^b   Ohkubo, Masataka ^b   Koyanagi, Masao ^b  

^a SEIKO INSTRUMENTS INC   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007906440     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1332411     Document Type: Article

References (8)

1. D. A. Wollman, K. D. Irwin, G. C. Hilton, L. L. Dulcie, D. E. Newbury, and J. M. Martinis, J. Microsc. 188, 196 (1997).
2. K. D. Irwin, G. C. Hilton, J. M. Martinis, S. Deiker, N. Bergren, S. W. Nam, D. A. Rudman, and D. A. Wollman, Proceedings of the 8th International Workshop on Low Temperature Detectors (LTD-81, 1999. Dalfsen, Netherlands.
3. K. Mitsuda and R. Kelley, Nucl. Instrum. Methods Phys. Res. A 436, 212 (1999).
4. R. Ladbury, Phys. Today 51, 19 (1998).
5. M. Ukibe, K. Tanaka, M. Koyanagi, T. Morooka, H. Pressler, M. Ohkubo, and N. Kobayashi, Proceedings of the 8th International Workshop on Low Temperature Detectors (LTD-8), 1999, Dalfsen. Netherlands.
6. M. Shikida, K. Sato, K. Tokoro, and D. Uchikawa, Proceedings of IEEE Micro Electro Mechanical Systems (MEMS) Workshop, 1999, Florida, p. 315.
7. F. Hirayama, N. Kasai, and M. Koyanagi, IEEE Trans. Appl. Supercond. 9, 2923 (1999).
8. K. D. Irwin, Appl. Phys. Lett. 66, 1998 (1995).