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Volumn 88, Issue 10, 2000, Pages 5975-5980

Edge-type misfit dislocations produced by thermal processing of pre-relaxed InxGa1-xAs/GaAs heterostructures

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EID: 0007598961     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1315615     Document Type: Article
Times cited : (8)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.