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IEEE Transactions on Instrumentation and Measurement
Volumn 48, Issue 2, 1999, Pages 289-292
A cheaper, simpler quantized Hall resistance standard
Author keywords

Quantum Hall effect; Resistance measurements; Semiconductor devices
Indexed keywords

EID: 0007567671     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.769585     Document Type: Article
Times cited : (9)
References (3)
  • 1
    • 0003662576 scopus 로고
    • Sources of uncertainty in a DVM-based measurement system for a quantized Hall resistance standard
    • May/June
    • K.C. Lee, M. E. Cage, and P. S. Rowe, "Sources of uncertainty in a DVM-based measurement system for a quantized Hall resistance standard," J. Res. Nat. Inst. Stand. Technol., vol. 99, pp. 227-240, May/June 1994.
    • (1994) J. Res. Nat. Inst. Stand. Technol. , vol.99 , pp. 227-240
    • Lee, K.C.1    Cage, M.E.2    Rowe, P.S.3
  • 2
    • 0026138732 scopus 로고
    • Industrial experience with a quantized Hall effect system
    • K.B. Jaeger, P. D. Levine, and A. Z. Craig, "Industrial experience with a quantized Hall effect system," IEEE Trans. Instrum. Meas., vol. 40, pp. 256-261, 1991.
    • (1991) IEEE Trans. Instrum. Meas. , vol.40 , pp. 256-261
    • Jaeger, K.B.1    Levine, P.D.2    Craig, A.Z.3
  • 3
    • 0031117857 scopus 로고    scopus 로고
    • Fabrication of precision quantized Hall devices
    • A.D. Inglis and I. Minowa, "Fabrication of precision quantized Hall devices," IEEE Trans. Instrum. Meas., vol. 46, pp. 281-284, 1997.
    • (1997) IEEE Trans. Instrum. Meas. , vol.46 , pp. 281-284
    • Inglis, A.D.1    Minowa, I.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.