Beam diagnostics challenges for future FELs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2988, Issue , 1997, Pages 70-77

  Lumpkin, Alex H ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Beam diagnostics; EELs; SER

Indexed keywords

LASERS; MICROMETERS; POSITION MEASUREMENT; RING LASERS; THICKNESS MEASUREMENT; X RAY LASERS;

BEAM DIAGNOSTICS; BUNCH LENGTHS; EELS; ELECTRON LASERS; EMITTANCE; HIGH POWERS; PEAK CURRENTS; RING FREE; SER; SPATIAL RESOLUTIONS; TEMPORAL RESOLUTIONS;

LASER DIAGNOSTICS;

EID: 0007457559     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.274369     Document Type: Conference Paper

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