Stable surface reconstructions on 6H-SiC(000 1̄ )

Materials Science and Engineering B

Volumn 61-62, Issue , 1999, Pages 207-211

  Bernhardt, J ^a   Nerding, M ^a   Starke, U ^a   Heinz, K ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Auger electron spectroscopy; Low energy electron diffraction; Reconstruction; Scanning tunneling microscopy; SiC surfaces

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; HEAT FLUX; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; STOICHIOMETRY; SURFACE PHENOMENA; SURFACE STRUCTURE; THERMAL EFFECTS;

SURFACE RECONSTRUCTION;

SILICON CARBIDE;

EID: 0007396741     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(98)00503-0     Document Type: Article

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