Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier layers by the piezoelectric effect

Applied Physics Letters

Volumn 73, Issue 21, 1998, Pages 3141-3143

  Milnes, J S ^a   Morhain, C ^a   Telfer, S A ^a   Urbaszek, B ^a   Galbraith, I ^a   Prior, K A ^a   Cavenett, B C ^a  

^a HERIOT WATT UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007142283     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122699     Document Type: Article

References (17)

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