Modeling and analysis of photomodulated reflectance and double crystal x-ray diffraction measurements of tensilely strained InGaAs/InGaAsP quantum well structures

Journal of Applied Physics

Volumn 83, Issue 9, 1998, Pages 4909-4917

  Rowland, G ^a   Hosea, T J C ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007085792     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367292     Document Type: Article

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