Bayesian reliability modeling for masked system lifetime data

Statistics and Probability Letters

Volumn 47, Issue 3, 2000, Pages 229-241

  Kuo, Lynn ^a   Yang, Tae Young ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b Myong Ji University   (South Korea)

Author keywords

Competing risk; Gibbs sampling; Incomplete data; Latent variable model

Indexed keywords

EID: 0006730544     PISSN: 01677152     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0167-7152(99)00160-1     Document Type: Article

References (29)

1. Aboul-Séoud, M.H., Usher, J.S., 1996. The effect of modular system structures on component reliability estimation, Fifth Industrial Engineering Research Conference Proceedings, pp. 464-467.
2. Dempster A., Laird N., Rubin D. Maximum likelihood from incomplete data via the EM algorithm. J. Roy. Statist. Soc. Ser. B. 39:1977;1-38.
3. Dinse G. Nonparametric prevalence and mortality estimators for animal experiments with incomplete cause-of-death data. J. Amer. Statist. Assoc. 81:1986;328-336.
4. Doganaksoy N. Interval estimation from censored & masked system-failure data. IEEE Trans. Reliab. 40:1991;280-286.
5. Flehinger B.J., Reiser B., Yashchin E. Inference about defects in the presence of masking. Technometrics. 38:1996;247-255.
6. Flehinger B.J., Reiser B., Yashchin E. Survival with competing risks and masked causes of failures. Biometrika. 85:1998;151-164.
7. Gastaldi T. Improved maximum likelihood estimation for component reliabilities with Miyakawa-Usher-Hodgson-Guess' estimators under censored search for the cause of failure. Statist. Probab. Lett. 19:1994;5-18.
8. Geisser S., Eddy W. A predictive approach to model selection. J. Amer. Statist. Assoc. 74:1979;153-160.
9. Gelfand A., Smith A.F.M. Sampling based approaches to calculating marginal densities. J. Amer. Statist. Assoc. 85:1990;398-409.
10. Geman S., Geman D. Stochastic relaxation, Gibbs distributions, and the Bayesian restoration of images. IEEE Trans. Pattern Anal. Mach. Intel. 6:1984;721-741.
11. Guess F.M., Usher J.S., Hodgson T.J. Estimating system and component reliabilities under partial information on cause of failure. J. Statist. Plann. Inference. 29:1991;75-85.
12. Guttman, I., Lin, D.K.J., Reiser, B., Usher, J.S., 1995. Dependent masking and system life data analysis: Bayesian inference for two-component systems. Lifetime Data Anal. 87-100.
13. Kuo L., Yang T. Bayesian computation for software reliability. J. Comput. Graph. Statist. 4:1995;1-18.
14. Kuo L., Yang T. Bayesian computation for nonhomogeneous Poisson processes in software reliability. J. Amer. Statist. Assoc. 91:1996;763-773.
15. Kuo, L., Yang, T., 1998. Bayesian reliability modeling for masked system lifetime data. Technical Report tr9810, Statistics Department, University of Connecticut.
16. Lin D.K.J., Guess F.M. System life data analysis with dependent partial knowledge on the exact cause of system failure. Microelectron. Reliab. 34:1994;535-544.
17. Lin D.K.J., Usher J.S., Guess F.M. Exact maximum likelihood estimation using masked system data. IEEE Trans. Reliab. 42:1993;631-635.
18. Lin D.K.J., Usher J.S., Guess F.M. Bayes estimation of component-reliability from masked system-life data. IEEE Trans. Reliab. 45:1996;233-237.
19. Metropolis N., Rosenbluth A.W., Rosenbluth M.N., Teller A.H., Teller E. Equations of state calculations by fast computing machines. J. Chem. Phys. 21:1953;1087-1091.
20. Miyakawa M. Analysis of incomplete data in a competing risks model. IEEE Trans. Reliab. 33:1984;293-296.
21. Mukhopadhyay C., Basu A.P. Bayesian analysis of incomplete time and cause of failure data. J. Statist. Plann. Inference. 59:1997;79-100.
22. Reiser B., Flehinger B.J., Conn A.R. Estimating component-defect probability form masked system success. / failure data IEEE Trans. Reliab. 45:1996;238-243.
23. Reiser B., Guttman I., Lin D.K.J., Guess F.M., Usher J.S. Bayesian inference for masked system lifetime data. Appl. Statist. 44:1995;79-90.
24. Sinha B., Zellner A. A note on the prior distributions of Weibull parameters. SCIMA. 19:1990;5-13.
25. Sinha, S., 1986. Reliability and Life Testing. Wiley, New York.
26. Tanner M.A., Wong W.H. The calculation of posterior distributions by data augmentation. J. Amer. Statist. Assoc. 82:1987;528-550.
27. Usher J. Weibull component reliability-prediction in the presence of masked data. IEEE Trans. Reliab. 45:1996;229-232.
28. Usher J., Hodgson T. Maximum likelihood analysis of component reliability using masked system life-test data. IEEE Trans. Reliab. 37:1988;550-555.
29. Yang, T., Kuo, L., 1999. Bayesian computation for the superposition of nonhomogeneous Poisson processes. Can. J. Statist., in press.