Force probe measurement of nanometer scale dielectric fluctuations near the glass transition

Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations

Volumn , Issue , 1997, Pages 615-619

  Walther, L E ^a   Israeloff, N E ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES; ELECTROMAGNETIC WAVE POLARIZATION; GLASS TRANSITION; SIGNAL NOISE MEASUREMENT; THERMODYNAMIC STABILITY;

DIELECTRIC POLARIZATION NOISE; NANOMETER SCALE DIELECTRIC FLUCTUATIONS;

SPURIOUS SIGNAL NOISE;

EID: 0031295634     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)