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1
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0029766729
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512 x 512 WISP (Wide Band Infrared Scene Projector) Arrays
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Technologies for Synthetic Environments: Hardware in the Loop Testing II
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B. Cole, R. Higashi, J. Ridley, J. Holmen, J. Arendt, C. Malone, R. Stockbridge, G. C. Goldsmith, L. Jones, "512 x 512 WISP (Wide Band Infrared Scene Projector) Arrays," SPIE Proceedings, Vol. 2741, Technologies for Synthetic Environments: Hardware in the Loop Testing II.
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SPIE Proceedings
, vol.2741
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Cole, B.1
Higashi, R.2
Ridley, J.3
Holmen, J.4
Arendt, J.5
Malone, C.6
Stockbridge, R.7
Goldsmith, G.C.8
Jones, L.9
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2
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0031289045
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Current status of the British Areospace resistor array IR scene projector technology
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Technologies for Synthetic Environments: Hardware in the Loop Testing II
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A.P. Pritchard, S.P. Lake, M.D. Balmond, S.W. Gough, M.A. Veneables,I.M. Sturland, G. Crisp, S.C. Watkin, "Current status of the British Areospace resistor array IR scene projector technology", SPIE Proceedings, Vol. 3084, Technologies for Synthetic Environments: Hardware in the Loop Testing II.
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SPIE Proceedings
, vol.3084
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Pritchard, A.P.1
Lake, S.P.2
Balmond, M.D.3
Gough, S.W.4
Veneables, M.A.5
Sturland, I.M.6
Crisp, G.7
Watkin, S.C.8
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3
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0031288743
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Recent progress in large dynamic resistor arrays
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Technologies for Synthetic Environments: Hardware in the Loop Testing II
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B. Cole, R. Higashi, J. Ridley, J. Holman, E. Benser, R. Stockbrige, L. Murrer, L. Jones, E. Burroughs, "Recent progress in large dynamic resistor arrays," SPIE Proceedings, Vol. 3084, Technologies for Synthetic Environments: Hardware in the Loop Testing II.
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SPIE Proceedings
, vol.3084
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Cole, B.1
Higashi, R.2
Ridley, J.3
Holman, J.4
Benser, E.5
Stockbrige, R.6
Murrer, L.7
Jones, L.8
Burroughs, E.9
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4
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0031288727
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Characterization measurements of the widebnd infrared scene resistor array, part two
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Technologies for Synthetic Environments: Hardware in the Loop Testing II
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L. Jones, R.G. Stockbridge, A. R. Andrews, W. L. Herald, "Characterization measurements of the widebnd infrared scene resistor array, part two." SPIE Proceedings, Vol. 3084, Technologies for Synthetic Environments: Hardware in the Loop Testing II.
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SPIE Proceedings
, vol.3084
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Jones, L.1
Stockbridge, R.G.2
Andrews, A.R.3
Herald, W.L.4
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5
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0031289240
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A simplified method for the hardware implementation of nonuniformity correction on a resistor array infrared scene projector
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Technologies for Synthetic Environments: Hardware in the Loop Testing II
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L. E. Jones, E. M. Olson, R. L. Murrer, Jr., A. R. Andrews, "A simplified method for the hardware implementation of nonuniformity correction on a resistor array infrared scene projector", SPIE Proceedings, Vol. 3084, Technologies for Synthetic Environments: Hardware in the Loop Testing II.
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SPIE Proceedings
, vol.3084
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Jones, L.E.1
Olson, E.M.2
Murrer Jr., R.L.3
Andrews, A.R.4
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6
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0031288736
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Performance limitiations and practical considerations associated with resistive emitter array nonuniformity correction (NUC)
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Technologies for Synthetic Environments: Hardware in the Loop Testing II
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Morre, D., Stanek, C., Peterson, C., "Performance limitiations and practical considerations associated with resistive emitter array nonuniformity correction (NUC)," SPIE Proceedings, Vol. 3084, Technologies for Synthetic Environments: Hardware in the Loop Testing II.
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SPIE Proceedings
, vol.3084
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Morre, D.1
Stanek, C.2
Peterson, C.3
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7
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58749107068
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Flynn, D.S., B. A. Sieglinger, R. L. Murrer, Jr., L. E. Jones, E. M. Olson, A. R. Andrews, J.A. Gordon III, Timing considerations for integrating a flickerless projector with an imaging sensor,SPIE Proceedings, 3084, Technologies for Synthetic Environments: Hardware in the Loop Testing II.
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Flynn, D.S., B. A. Sieglinger, R. L. Murrer, Jr., L. E. Jones, E. M. Olson, A. R. Andrews, J.A. Gordon III, "Timing considerations for integrating a flickerless projector with an imaging sensor",SPIE Proceedings, Vol. 3084, Technologies for Synthetic Environments: Hardware in the Loop Testing II.
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