Characterization measurements of the wideband infrared scene projector resistor array, part two

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3084, Issue , 1997, Pages 31-47

  Jones, Lawrence E ^a   Stockbridge, Robert G ^a   Andrews, Allen R ^a   Herald, W Larry ^a   Guertin, Andrew W ^a  

^a SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

Author keywords

Apparent Temperature; Dynamic Range; Emissivity Fillfactor; Fall Time; GWEF; IR Hardware in the Loop; KHILS; Resistor Array; Rise Time; Spectral Curves; WISP

Indexed keywords

ARRAYS; BALLISTICS; COMPUTER HARDWARE; COMPUTER SIMULATION; IMAGE SENSORS; INFRARED IMAGING; KINETIC ENERGY; OPTICAL DESIGN; OPTICAL RESOLVING POWER; RESISTORS;

HARDWARE-IN-THE-LOOP (HWIL) SIMULATION; PROJECTOR RESISTOR ARRAYS;

OPTICAL PROJECTORS;

EID: 0031288727     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.280970     Document Type: Conference Paper

References (2)

1. Characterization and nonuniformity correction of a resistor array infrared scene projector
2. Characterization measurements of the wideband infrared scene projector resistor array