A hinge goniometer head

Journal of Applied Crystallography

Volumn 32, Issue 3, 1999, Pages 576-578

  Katrusiak, Andrzej ^a  

^a ADAM MICKIEWICZ UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006134179     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188989801406X     Document Type: Article

References (12)

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3. Arndt, U. W. & Willis, B. T. M. (1966). Single Crystal Diffractometry, pp. 78-80. Cambridge University Press.
4. Busing, W. R. & Levy, H. A. (1967). Acta Cryst. 22, 457-464.
5. Dera, P. & Katrusiak, A. (1998). Acta Cryst. A54, 653-660.
6. Dera, P. & Katrusiak, A. (1999). J. Appl. Cryst. Submitted.
7. Furnas, T. C. & Harker, D. (1955). Rev. Sci. Instrum. 26, 449.
8. Guinier, A. (1956). Acta Cryst. 9, 976.
9. Hamilton, W. C. (1974). International Tables for X-ray Crystallography, Vol. IV, pp. 273-284. Birmingham: Kynoch Press.
10. Huber (1995). Huber X-ray Diffraction Equipment. Rimsting, Germany: Huber.
11. King, H. E. Jr & Finger, L. W. (1979). J. Appl. Cryst. 12, 374-378.
12. Merrill, L. & Bassett, W. A. (1974). Rev. Sci. Instrum. 45, 290-294.