Towards General Diffractometry. I. Normal-Beam Equatorial Geometry

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 54, Issue 5, 1998, Pages 653-660

  Dera, Przemysław ^a   Katrusiak, Andrzej ^a  

^a ADAM MICKIEWICZ UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000269186     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767398002815     Document Type: Article

References (13)

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4. Finger, L. W. & King, H. (1978). Am. Mineral. 63, 337-342.
5. Hamilton, W. C. (1974). International Tables for X-ray Crystallography, Vol. IV, pp. 273-284. Birmingham: Kynoch Press. (Present distributor Kluwer Academic Publishers, Dordrecht.)
6. Katrusiak, A. & Ryan, T. W. (1988). Acta Cryst. A44, 623-627.
7. Kucharczyk, D., Malinowski, M., Paciorek, W. & Uszyński, I. (1986). KM-4 Diffractometer Users Manual. KUMA Diffraction, Wrocław, Poland.
8. Loveday, J. S., MacMahon, M. I. & Nelmes, R. J. (1990). J. Appl. Cryst. 23, 392-396.
9. Merrill, L. & Bassett, W. A. (1974). Rev. Sci. Instrum. 45, 290-294.
10. Poot, S. (1972). United States Patent No. 3,636,347.
11. Schwarzenbach, D. & Flack, H. D. (1992a). J Appl. Cryst. 25, 69-72.
12. Schwarzenbach, D. & Flack, H. D. (1992b). J. Appl. Cryst. 25, 455-459.
13. Thomas, D. J. (1990). Acta Cryst. A46, 321-343.