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Volumn 9, Issue 5, 2001, Pages 431-454

Electrical process tomography with known internal structures and resistivities

Author keywords

Electrical impedance tomography; Finite element method; Image reconstruction; Internal structures; Process tomography

Indexed keywords


EID: 0006102946     PISSN: 10682767     EISSN: None     Source Type: Journal    
DOI: 10.1080/174159701088027775     Document Type: Article
Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.