Limitations of the pulse-shape technique for particle discrimination in planar Si detectors

IEEE Transactions on Nuclear Science

Volumn 44, Issue 3 PART 1, 1997, Pages 1040-1045

  Pausch, G ^a   Moszynski M ^b   Bohne, W ^c   Cederkall J ^d   Grawe, H ^e   Klamra, W ^d   Lampert, M O ^f   Rohr, P ^f   Schubart, R ^e   Seidel, W ^a   Wolski, D ^b  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

^c HAHN MEITNER INSTITUT   (Germany)

^d ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^e GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^f Eurisys Mesures   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006098995     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.603801     Document Type: Article

References (5)

1. G. Pausch et al., "Identification of light charged particles and heavy ions in silicon detectors by means of pulse-shape discrimination", IEEE Transact. Nucl. Sci., Vol. 43, pp. 1097-1101, 1996, and references therein.
2. F.Z. Henari et al., "The influence of inhomogeneities in materials properties in silicon radiation detectors", Nucl. Instr. and Meth., vol. A 288, pp. 439-450, 1990.
3. W. Seidel et al., "Double-grid avalanche counter with large dynamic range", Nucl. Instr. and Meth., vol. A 273, pp. 536-540, 1988.
4. W. Bohne et al., "The influence of plasma effects on the timing properties of surface-barrier detectors for heavy ions", Nucl. Instr. and Meth., vol. A 240, pp. 145-151, 1985.
5. H.A. Rijken, "Detection methods for depth profiling of light elements using high energy alpha particles", PhD Thesis, Technische Universiteit Eindhoven, Oct. 1993.