Identification of light charged particles and heavy ions in silicon detectors by means of pulse-shape discrimination

IEEE Transactions on Nuclear Science

Volumn 43, Issue 3 PART 2, 1996, Pages 1097-1101

  Pausch, G ^a   Ortlepp, H G ^a   Bohne, W ^b   Grawe, H ^b   Hilscher, D ^b   Moszynski M ^c   Wolski, D ^c   Schubart, R ^d   De Angelis, G ^e   De Poli, M ^e  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

^d GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^e LABORATORI NAZIONALI DI LEGNARO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; COMPUTER SIMULATION; ELECTRIC CHARGE; ELECTRIC CURRENTS; ION BEAMS; IONS; NEUTRON DETECTORS; NEUTRONS; PARTICLE BEAM DYNAMICS; RADIOISOTOPES; SILICON SENSORS; TITANIUM;

HEAVY IONS; INTERMEDIATE MASS FRAGMENTS; LIGHT CHARGED PARTICLES; MULTIDETECTOR ARRAYS; PULSE SHAPE DISCRIMINATION; REVERSE MOUNT; SILICON BALLS;

PARTICLE DETECTORS;

EID: 20244364508     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.506644     Document Type: Article

References (13)

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