-
1
-
-
0022752256
-
Signal, noise, and codes in optical memories
-
D. Treves and D. S. Bloomberg, “Signal, noise, and codes in optical memories,” Opt. Eng. 25, 881-891 (1986).
-
(1986)
Opt. Eng.
, vol.25
, pp. 881-891
-
-
Treves, D.1
Bloomberg, D.S.2
-
2
-
-
0001696051
-
Sources of noise in erasable optical disk data storage
-
C. Peng and M. Mansuripur, “Sources of noise in erasable optical disk data storage,” Appl. Opt. 37, 921-928 (1998).
-
(1998)
Appl. Opt.
, vol.37
, pp. 921-928
-
-
Peng, C.1
Mansuripur, M.2
-
3
-
-
84956117434
-
Analysis of retrieval signal deterioration caused by disk surface roughness
-
Y. Honguh, “Analysis of retrieval signal deterioration caused by disk surface roughness,” Jpn. J. Appl. Phys. Suppl. 28-33, 115-119 (1989).
-
(1989)
Jpn. J. Appl. Phys. Suppl.
, vol.28-33
, pp. 115-119
-
-
Honguh, Y.1
-
4
-
-
0024923516
-
Progress and issues of phasechange erasable optical recording media
-
K. A. Rubin and M. Chen, “Progress and issues of phasechange erasable optical recording media,” Thin Solid Films 181, 129-139 (1989).
-
(1989)
Thin Solid Films
, vol.181
, pp. 129-139
-
-
Rubin, K.A.1
Chen, M.2
-
5
-
-
84893878597
-
-
Piscataway, N.J
-
K. Saito, N. Miyagawa, and M. Mansuripur, “Optical disk noise analysis using rigorous vector diffraction calculations,” in 2000 Optical Data Storage Topical Meeting (Institute of Electrical and Electronics Engineers, Piscataway, N.J., 2000), pp. 56-58.
-
(2000)
Optical Disk Noise Analysis Using Rigorous Vector Diffraction Calculations, in 2000 Optical Data Storage Topical Meeting Institute of Electrical and Electronics Engineers
, pp. 56-58
-
-
Saito, K.1
Miyagawa, N.2
Mansuripur, M.3
-
6
-
-
84957337478
-
Disk noise of quadrilayer MnBi magneto-optical disks
-
M. Nakada and M. Okada, “Disk noise of quadrilayer MnBi magneto-optical disks,” Jpn. J. Appl. Phys. Part 1 33, 6577-6581 (1994).
-
(1994)
Jpn. J. Appl. Phys
, vol.33
, pp. 6577-6581
-
-
Nakada, M.1
Okada, M.2
-
9
-
-
0018443213
-
Relationship between surface scattering and microtopographic features
-
E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features,” Opt. Eng. 18, 125-136 (1979).
-
(1979)
Opt. Eng.
, vol.18
, pp. 125-136
-
-
Church, E.L.1
Jenkinson, H.A.2
Zavada, J.M.3
-
10
-
-
0031704297
-
Light scattering angular distribution of a mirror-polished CoCr20WNi (Alacrite XSH); application to the determination of statistical parameters characterizing the surface roughness
-
C. Zerrouki, F. Miserey, and P. Pinot, “Light scattering angular distribution of a mirror-polished CoCr20WNi (alacrite XSH); application to the determination of statistical parameters characterizing the surface roughness,” Eur. Phys. J. Appl. Phy. 1, 253-259 (1998).
-
(1998)
Eur. Phys. J. Appl. Phy.
, vol.1
, pp. 253-259
-
-
Zerrouki, C.1
Miserey, F.2
Pinot, P.3
-
11
-
-
0029536478
-
Roughness measurement of dielectrics with light scatter
-
J. C. Stover, ed., Proc. SPIE
-
M. Bernt and J. C. Stover, “Roughness measurement of dielectrics with light scatter,” in Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries, J. C. Stover, ed., Proc. SPIE 2541, 36-44 (1995).
-
(1995)
Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries
, vol.2541
, pp. 36-44
-
-
Bernt, M.1
Stover, J.C.2
-
12
-
-
0027639004
-
Wavelength and angular dependence of light scattering from beryllium: Com parison of theory and experiment
-
J. M. Elson, J. M. Bennett, and J. C. Stover, “Wavelength and angular dependence of light scattering from beryllium: com parison of theory and experiment,” Appl. Opt. 32, 3362-3376 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 3362-3376
-
-
Elson, J.M.1
Bennett, J.M.2
Stover, J.C.3
-
13
-
-
0037757595
-
Reflection coefficients for certain rough surfaces
-
V. Twersky, “Reflection coefficients for certain rough surfaces,” J. Appl. Phys. 24, 659-660 (1953).
-
(1953)
J. Appl. Phys.
, vol.24
, pp. 659-660
-
-
Twersky, V.1
-
14
-
-
0000438638
-
New formulation of the Fourier modal method for crossed surface-relief gratings
-
L. Li, “New formulation of the Fourier modal method for crossed surface-relief gratings,” J. Opt. Soc. Am. A 14, 2758-2767 (1997).
-
(1997)
J. Opt. Soc. Am. A
, vol.14
, pp. 2758-2767
-
-
Li, L.1
-
15
-
-
0038448916
-
Substrate noise in optical data-storage systems
-
C. Peng, M. Mansuripur, M. Ikenishi, and M. Miura, “Substrate noise in optical data-storage systems,” Appl. Opt. 40, 3379-3386 (2001).
-
(2001)
Appl. Opt.
, vol.40
, pp. 3379-3386
-
-
Peng, C.1
Mansuripur, M.2
Ikenishi, M.3
Miura, M.4
|