Electric field effects in scanning tunnelingmicroscope imaging

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Stokbro, K ^a   Quaade, U ^a   Grey, F ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ADJUSTABLE PARAMETERS; ELECTRONIC STRUCTURE CALCULATIONS; FIRST-PRINCIPLES; HIGH-VOLTAGE EXTENSION; HYDROGEN DEFECTS; SCANNING TUNNELING MICROSCOPES; STM IMAGES; THEORETICAL MODELS;

ELECTRONIC STRUCTURE; SURFACE DEFECTS; WIND TUNNELS;

ELECTRIC FIELD EFFECTS;

EID: 0005722838     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051265     Document Type: Article

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