|
Volumn 266-269 A, Issue , 2000, Pages 553-557
|
Defect re-distribution in amorphous silicon below equilibration temperature
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0005613404
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/s0022-3093(99)00845-5 Document Type: Article |
Times cited : (4)
|
References (9)
|