Correlation of nuclear spectrometer performance with uniformity and resistivity in cadmium zinc telluride

IEEE Transactions on Nuclear Science

Volumn 44, Issue 3 PART 1, 1997, Pages 499-503

  Toney, I E ^a   Brunett, B A ^a   Schlesinger, T E ^a   James, R B ^b   Eissler, E E ^c  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c eV Products   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005500113     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.603699     Document Type: Article

References (4)

1. J.M. Van Scyoc, J.C. Lund, D.H. Morse, A.J. Antolak, R.W. Olsen, R.B. James, M.Schieber, H. Yoon, M.S. Goorsky, J.Toney and T.E. Schlesinger, "Material Inhomogeneities in Cd(1-x)Zn(x)Te and their Effects on Large Volume Gamma-Ray Detectors," Journal of Electronic Materials, vol. 25, pp. 1323-1327, August 1996.
2. J.E. Toney, B.A. Brunett, T.E. Schlesinger, H. Yoon, J.M. Van Scyoc, A.J. Antolak, D.H. Morse, E.E. Eissler, C.J. Johnson, J.C. Lund, and R.B. James, "Composition and Performance Mapping of CdZnTe Nuclear Spectrometers," SPIE Proceedings, vol. 2859, pp. 17-23 , August 1996.
3. xTe Grown by High-Pressure Bridgman," Nuclear Instruments & Methods in Physics Research A , vol. 380, pp. 132-135, October 1996.
4. xTe Films Grown by Molecular Beam Epitaxy on GaAs Substrates," Applied Physics Letters, vol. 47, pp. 1172-1174 , December 1985.