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Volumn 46, Issue SUPPL.1, 2001, Pages

Three-channel X-ray detection head for diagnostics of plasma in noisy environment

Author keywords

High temperature plasma; Semiconductor detector; X ray diagnostics

Indexed keywords


EID: 0005369047     PISSN: 00295922     EISSN: 15085791     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (4)
  • 1
    • 0010179723 scopus 로고    scopus 로고
    • Fast detection head for X-ray diagnostics of plasma focus
    • Kaczmarczyk J, Paduch M, Ryć L, Tomaszewski K (1999) Fast detection head for X-ray diagnostics of plasma focus. J Tech Phys 40;1:391-394
    • (1999) J Tech Phys , vol.40 , Issue.1 , pp. 391-394
    • Kaczmarczyk, J.1    Paduch, M.2    Ryć, L.3    Tomaszewski, K.4
  • 2
    • 33645977867 scopus 로고    scopus 로고
    • X-ray diagnostics of laser plasmas with the use of semiconductor detectors
    • Ghent, Belgium
    • Ryć L (1999) X-ray diagnostics of laser plasmas with the use of semiconductor detectors. In: Int Workshop on Plasma Diagnostics. Ghent, Belgium: 77-78
    • (1999) Int Workshop on Plasma Diagnostics , pp. 77-78
    • Ryć, L.1
  • 3
    • 26344432565 scopus 로고    scopus 로고
    • Silicon photodiodes for registration of X-rays from laser plasma
    • Krynica, Poland
    • Słysz W, Ryć L (1997) Silicon photodiodes for registration of X-rays from laser plasma. In: Proc 6th Conf ELTE'97. Krynica, Poland: 174-179
    • (1997) Proc 6th Conf ELTE'97 , pp. 174-179
    • Słysz, W.1    Ryć, L.2
  • 4
    • 33645963544 scopus 로고    scopus 로고
    • High-resistivity silicon p-i-n diodes for detection of ionising radiation
    • Osvald J (ed) ASDAM 2000, Smolenice Castle, Slovakia. IEEE Inc., Piscataway
    • Słysz W, Ryć L, Wȩgrzecki M (2000) High-resistivity silicon p-i-n diodes for detection of ionising radiation. In: Osvald J (ed) Proc 3rd Int EuroConf on Advanced Semiconductor Devices and Microsystems, ASDAM 2000, Smolenice Castle, Slovakia. IEEE Inc., Piscataway, pp 461-464
    • (2000) Proc 3rd Int EuroConf on Advanced Semiconductor Devices and Microsystems , pp. 461-464
    • Słysz, W.1    Ryć, L.2    Wȩgrzecki, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.