Electromigration induced dynamics of surface dislocations and atomic steps

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 4, 1999, Pages 1693-1695

  Shimoni, N ^a   Biham, O ^a   Millo, O ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005193483     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581874     Document Type: Article

References (13)

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6. S. G. Corcoran, R. J. Colton, E. T. Lilleodden, and W. W. Gerberich, in Proceedings of Thin Films: Stresses and Mechanical properties VI. Symposium, edited by W. W. Gerberich et al. (MRS, Pittsburgh, 1997), p. 159.
7. K. Hinode, T. Furusawa, and Y. Homma, Proceedings of Second International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings, New York, 1994) p. 220.
8. S. P. Baker, M. P. Knauss, U. E. Mockl, and E. Arzt, in Proceedings of Thin Films: Stresses and Mechanical properties V. Symposium, edited by S. P. Baker et al. (MRS, Pittsburgh, 1995) p. 483.
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13. See e.g., B. B. Mandelbrot, The Fractal Geometry of Nature (Freeman, San Francisco, 1982).