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Volumn 69, Issue 13, 1996, Pages 1876-1878

High quality fluorinated silicon oxide films prepared by plasma enhanced chemical vapor deposition at 120 °C

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Indexed keywords


EID: 0005077920     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117463     Document Type: Article
Times cited : (16)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.