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Volumn 69, Issue 13, 1996, Pages 1876-1878
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High quality fluorinated silicon oxide films prepared by plasma enhanced chemical vapor deposition at 120 °C
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0005077920
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.117463 Document Type: Article |
Times cited : (16)
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References (13)
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