Analysis of the Scattering Properties of Defects of Layered Substrates

Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

Volumn 88, Issue 2, 2000, Pages 246-252

  Grishina, N V ^a   Eremin, Yu A ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT POLARIZATION; LIGHT SCATTERING; OPTICAL FILMS;

LAYERED SUBSTRATES;

QUANTUM OPTICS;

EID: 0005025282     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.626787     Document Type: Article

References (10)

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4. Yu. A. Eremin and N. V. Orlov, Opt. Spektrosk. 84, 625 (1998) [Opt. Spectrosc. 84, 557 (1998)].
5. N. V. Grishina and Yu. A. Eremin, Opt. Spektrosk. 86, 475 (1999) [Opt. Spectrosc. 86, 415 (1999)].
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7. N. V. Grishina, Opt. Spektrosk. 80, 123 (1996) [Opt. Spectrosc. 80, 109 (1996)].
8. N. V. Grishina, Opt. Spektrosk. 80, 123 (1996) [Opt. Spectrosc. 80, 109 (1996)].
9. Yu. A. Eremin and A. G. Sveshnikov, Method of Discrete Sources in Problems of Electromagnetic Diffraction (Moscow State University, Moscow, 1992).
10. Yu. A. Eremin, N. V. Orlov, and V. I. Rozenberg, Opt. Spektrosk. 73, 958 (1992).