Ellipsometric and low energy electron diffraction study of the layer growth of xenon physisorbed on Ag (111) surface

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 3, 1998, Pages 974-978

  Igarashi, S ^a   Abe, Y ^a   Irie, Y ^a   Hirayama, T ^a   Arakawa, I ^a  

^a GAKUSHUIN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005018507     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581480     Document Type: Article

References (20)

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