Ellipsometric study of rare gas films physisorbed on a surface of a metal single crystal

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2873, Issue , 1996, Pages 230-233

  Igarashi, Sin Ichi ^a   Abe, Yukiko ^a   Hirayama, Takato ^a   Arakawa, Ichiro ^a  

^a GAKUSHUIN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION ISOTHERMS; ELLIPSOMETRY; POLARIZATION; VAN DER WAALS FORCES;

ELLIPSOMETERS; EQUILIBRIUM PRESSURE; EXPERIMENTAL EQUIPMENTS; NULL ELLIPSOMETER; PRESSURE RANGES; SATURATION VAPOR PRESSURE; SUBSTRATE TEMPERATURE; VACUUM CHAMBERS;

SINGLE CRYSTALS;

EID: 0347250335     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.246227     Document Type: Conference Paper

References (10)

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