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Volumn 14, Issue 6, 1996, Pages 3938-3941

Fabrication of laterally selected Si doped layer in GaAs using a low-energy focused ion beam/molecular beam epitaxy combined system

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[No Author keywords available]

Indexed keywords


EID: 0004900957     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588699     Document Type: Article
Times cited : (5)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.