Detection of surface defects on thin metallic wires by geometric conical diffraction

Wire Journal International

Volumn 33, Issue 8, 2000, Pages 124-127

  Sánchez Brea, Luis Miguel ^a   Siegmann, Philip ^a   Bernabeu, Eusebio ^a   Rebollo, M A ^a   Perez Quintian F ^a   Raffo, C A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004764977     PISSN: 02774275     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. D.J. Whitehouse, "Surface Metrology," Meas. Sci. Technol., 8, pp. 955-972, 1997.
2. S. Gómez, K. Hale, J. Burrows and B. Griffiths, "Measurements of surface defects on optical components," Meas. Sci. Technol., 9, pp. 607-616, 1998.
3. C. Babu Rao, A.V. Ananthalakshmi and R. Kesavamoorthy, "Manifestation of surface roughness of thin wires in laser scattering," Proceedings of National Laser Symposium, Dehradun, India, February 1995.
4. th World Conference on Non Destructive Testing, New Delhi, India, December 1996.
5. a Reunión Nacional de Física, La Plata, Argentina, September 1998.
6. F. Perez-Quintian, M.A. Rebollo and N.G. Gaggioli, Proceedings of the 7th European Conference of Non-destructive Testing, Copenhagen, Denmark, May 1998.
7. H. Hönl, A.W. Maue and K. Westpfahl, Handbuch der Physik, XXV, 1. Springer-Verlag, Berlin, Germany, 1961.