-
1
-
-
0003989857
-
-
H.J. Guntherodt, R. Wiesendanger (Eds.), Springer-Verlag, Berlin
-
S. Chiang, in: H.J. Guntherodt, R. Wiesendanger (Eds.), Scanning Tunneling Microscopy I, Springer-Verlag, Berlin, 1992, p. 181.
-
(1992)
Scanning Tunneling Microscopy I
, pp. 181
-
-
Chiang, S.1
-
2
-
-
0346951416
-
-
R. Wiesendanger (Ed.), Springer-Verlag, Berlin
-
T.A. Jung, F.J. Himpsel, R.R. Schlittler, J.K. Gimzewski, in: R. Wiesendanger (Ed.), Scanning Probe Microscopy, Springer-Verlag, Berlin, 1998, p. 11.
-
(1998)
Scanning Probe Microscopy
, pp. 11
-
-
Jung, T.A.1
Himpsel, F.J.2
Schlittler, R.R.3
Gimzewski, J.K.4
-
7
-
-
0006823560
-
-
D.C. Parks, N.A. Clark, D.M. Walba, P.D. Beale, Phys. Rev. Lett. 70 (1993) 607.
-
(1993)
Phys. Rev. Lett.
, vol.70
, pp. 607
-
-
Parks, D.C.1
Clark, N.A.2
Walba, D.M.3
Beale, P.D.4
-
10
-
-
0001575939
-
-
J.K. Spong, H.A. Mizes, L.J. LaComb, M.M. Dovek, J.E. Frommer, J.S. Foster, Nature 338 (1990) 137.
-
(1990)
Nature
, vol.338
, pp. 137
-
-
Spong, J.K.1
Mizes, H.A.2
LaComb, L.J.3
Dovek, M.M.4
Frommer, J.E.5
Foster, J.S.6
-
11
-
-
33745582567
-
-
W. Mizutani, M. Shigeno, M. Ono, K. Kajimura, App. Phys. Lett. 56 (1990) 1974.
-
(1990)
App. Phys. Lett.
, vol.56
, pp. 1974
-
-
Mizutani, W.1
Shigeno, M.2
Ono, M.3
Kajimura, K.4
-
13
-
-
0032305492
-
-
Z. Klusek, W. Olejniczak, S. Pawlowski, P. Kobierski, Electron Technol. 31 (1998) 508.
-
(1998)
Electron Technol.
, vol.31
, pp. 508
-
-
Klusek, Z.1
Olejniczak, W.2
Pawlowski, S.3
Kobierski, P.4
-
18
-
-
4243347567
-
-
J. Xhie, K. Sattler, U. Muller, N. Venkateswarn, G. Raina, Phys. Rev. B 43 (1991) 8917.
-
(1991)
Phys. Rev. B
, vol.43
, pp. 8917
-
-
Xhie, J.1
Sattler, K.2
Muller, U.3
Venkateswarn, N.4
Raina, G.5
-
19
-
-
0346321503
-
-
M. Shigeno, M. Ohmi, M. Suginoya, W. Mizutani, Mol. Cryst. Liq. Cryst. 199 (1991) 141.
-
(1991)
Mol. Cryst. Liq. Cryst.
, vol.199
, pp. 141
-
-
Shigeno, M.1
Ohmi, M.2
Suginoya, M.3
Mizutani, W.4
-
22
-
-
0000569076
-
-
J. Xhie, K. Sattler, U. Muller, N. Venkateswaran, G. Raina, J. Vac. Sci. Technol. B 9 (1991) 833.
-
(1991)
J. Vac. Sci. Technol. B
, vol.9
, pp. 833
-
-
Xhie, J.1
Sattler, K.2
Muller, U.3
Venkateswaran, N.4
Raina, G.5
-
25
-
-
0001198684
-
-
P. Radojkovic, M. Schwartzkopff, M. Enachescu, E. Stefanov, E. Hartmann, F. Koch, J. Vac. Sci. Technol. B14 (1996) 1229.
-
(1996)
J. Vac. Sci. Technol.
, vol.B14
, pp. 1229
-
-
Radojkovic, P.1
Schwartzkopff, M.2
Enachescu, M.3
Stefanov, E.4
Hartmann, E.5
Koch, F.6
-
28
-
-
24244481807
-
-
M. Dorogi, J. Gomez, R. Osifchin, R.P. Andres, R. Reifenberger, Phys. Rev. B 52 (1995) 9071.
-
(1995)
Phys. Rev. B
, vol.52
, pp. 9071
-
-
Dorogi, M.1
Gomez, J.2
Osifchin, R.3
Andres, R.P.4
Reifenberger, R.5
-
32
-
-
0030540925
-
-
J.G.A. Dubois, J.W. Gerritsen, S.E. Shafranjuk, E.J.G. Boon, G. Schmid, H. van Kempen, Europhys. Lett. 33 (4) (1996) 279.
-
(1996)
Europhys. Lett.
, vol.33
, Issue.4
, pp. 279
-
-
Dubois, J.G.A.1
Gerritsen, J.W.2
Shafranjuk, S.E.3
Boon, E.J.G.4
Schmid, G.5
Van Kempen, H.6
-
34
-
-
0001135038
-
-
D.M. Eigler, P.S. Weiss, E.K. Schweizer, N.D. Lang, Phys. Rev. Lett. 66 (1991) 1189.
-
(1991)
Phys. Rev. Lett.
, vol.66
, pp. 1189
-
-
Eigler, D.M.1
Weiss, P.S.2
Schweizer, E.K.3
Lang, N.D.4
-
37
-
-
0026899344
-
-
W. Mizutani, M. Shigeno, K. Kajimura, M. Ono, Ultramicroscopy 42-44 (1992) 236.
-
(1992)
Ultramicroscopy
, vol.42-44
, pp. 236
-
-
Mizutani, W.1
Shigeno, M.2
Kajimura, K.3
Ono, M.4
|