Direct observation of stacking fault structure in (111) tabular silver halide grains by high-resolution electron microscopy

Journal of Imaging Science and Technology

Volumn 42, Issue 5, 1998, Pages 399-401

  Chen, Samuel ^a   Jagannathan, S ^a   Mehta, R V ^a   Jagannathan, R ^a   Taddei, A E ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004645842     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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