Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals

Journal of Crystal Growth

Volumn 172, Issue 3-4, 1997, Pages 426-432

  Goessens, C ^a,b   Schryvers, D ^a   Van Landuyt, J ^a   De Keyzer, R ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; EMULSIONS; MORPHOLOGY; PRECIPITATION (CHEMICAL); TWINNING;

DEFECT STRUCTURE; NEEDLE CRYSTALS; SILVER BROMIDE;

SEMICONDUCTING SILVER COMPOUNDS;

EID: 0031103813     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00750-6     Document Type: Article

References (9)

1. C. Goessens, D. Schryvers, J. Van Landuyt, S. Amelinckx, A. Verbeeck and R. De Keyzer, J. Crystal Growth 110 (1991) 930.
2. J. Maskasky, J. Imaging Sci. 31 (1987) 15.
3. J. Maskasky, J. Imaging Sci. 31 (1987) 93.
4. D. Hamilton and R. Seidensticker, J. Appl. Phys. 31 (1960) 1165.
5. R. Jagannathan, R. Mehta, J. Timmons and D. Black, Phys. Rev. B 48 (1993) 13261.
6. C. Goessens, D. Schryvers, J. Van Landuyt, A. Millan and R. De Keyzer, J. Crystal Growth 151 (1995) 335.
7. C. Van Roost, private communication.
8. J. Maskasky, J. Imaging Sci. 30 (1986) 247.
9. E. Klein, H. Metz and E. Moisar, in: Mitteilingen aus den Forschungslaboratorien der Agfa-Gevaert AG Leverkusen (Springer, Berlin, 1964).