Modern imaging techniques for metals and alloys

Current Opinion in Solid State and Materials Science

Volumn 3, Issue 3, 1998, Pages 317-324

  De Hosson, Jeff Th M ^a  

^a NETHERLANDS INSTITUTE FOR METALS RESEARCH   (Netherlands)

Author keywords

FEG field emission gun; HRTEM high resolution transmission electron microscopy microscope

Indexed keywords

EID: 0004536742     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0286(98)80108-3     Document Type: Article

References (88)

1. Hirsch P.B., Howie A, Nicholson R.B., Pashley D.W., Whelan M.J. Electron Microscopy of Thin Crystals. 1965;156 Butterworths, London.
2. Reimer L. Transmission Electron Microscopy. 1984;Springer-Verlag, Berlin.
3. Thomas G, Goringe M.J. Transmission Electron Microscopy of Materials. 1979;Wiley, New York.
4. Heidenreich R.D. Fundamentals of Transmission Electron Microscopy of Materials. 1967;Eiley, New York.
5. Cockayne D.H. Amelinck S. Diffraction and Imaging Techniques in Materials Science. 1978;253 North-Holland, Amsterdam.
6. Loretto M.H., Smallman R.E. Defect Analysis in Electron Microscopy. 1975;Chapman and Hall, London.
7. Forwood C.T., Clarebrough LM. Electron Microscopy of Interfaces in Metals and Alloys. 1991;Adam Hilger, Bristol.
8. Spence J. 2 Edition. Experimental High-Resolution Electron Microscopy. 1988;Oxford University press, Oxford.
9. Buseck P, Cowley J, Eyring L. High-Resolution Transmission Electron Microscopy. 1988;Oxford University press, Oxford.
10. Amelinckx S, van Dijck D, van Landuyt J, van Tenderloo G. Handbook of Microscopy. 1:1997;VCH-publisher, Weinheim.
11. Kubin L.P., Canova G, Condat M, Devincre B, Pontikis V, Brechet Y. Solid State Phenomena. 455:1992;23-24.
12. Kubin L.P., Canova G. Messerschmidt U. Electron Microscopy and Fracture Research. 1990;23 Academic Verlag, Berlin.
13. van der Giessen E, Needleman A. Computational Material Modeling. 294:1983;53 ASME.
14. Sutton A.P., Vitek V. On the structure of the tilt grain boundary in cubic metals. I Symmetry tilt boundaries. Phil Trans R Soc Lond A. 309:1983;1-36.
15. De Hosson J.Th.M., Vitek V. Atomic structure of (111) twist grain boundaries in f.c.c. metals. Phil Mag A. 61:1990;305-327.
16. Sutton A.P., Balluffi R.W. Interfaces in Crystalline Materials. 1995;Clarendon Press, Oxford.
17. Pestman B.P., De Hosson J.Th.M., Vitek V, Schapink F.W. Interaction between lattice dislocation and grain biundaries in f.c.c. and oredered compounds: a computer simulation. Phil Mag A. 64:1991;951-969.
18. 3Al investigated by means of in situ TEM and computer modelling experiments. Acta Metall Mater. 40:1992;2511-2521.
19. Rühle M, Heuer A.H., Evans A.G., Ashby M.F. Proceedings of the International Symposium on Metal/Ceramic Interfaces: 1991 July. Acta Metall Mater. 40:1992;S1-S361.
20. Holt D.J. Dislocation cell formation in metals. J Appl Phys. 41:1970;3197.
21. Kratochvil J, Saxlová M. Solid State Phenomena. 23-24:1992;369.
22. Kratochvil J, Orlová A. Instability origin of dislocation substructure. Phil Mag. 61:1990;281-290.
23. Kratochvil J. J Mech Behav Met. 2:1990;353.
24. Aifantis EC. Suzuki H. Dislocations in Solids. 1985;41 Tokyo University Press, Tokyo.
25. Aifantis EC. The physics of plastic deformation. Int J Plasticity. 3:1987;211-244.
26. Aifantis EC. Kubin L, Martin G. Non Linear Phenomena in Material Science. 1988;397 Trans Tech Publications, Aedermannsdorf, Switzerland.
27. Asaro R.J. Geometrical effects in the inhomogeneous deformation of ductile single crystals. Acta Metall. 27:1979;445-453.
28. Hähner P, Kubin L.P. Solid State Phenomena. 23-24:1992;385.
29. De Hosson J.Th.M., Kanert O, Sleeswijk A.W. Nabarro F.R.N. Dislocations in Solids. 6:1983;441 North-Holland, Amsterdam.
30. Nichols C.S., Clarke D.R. Critical currents in inhomogeneous Josephson arrays: a model for polycrystalline superconductors. Acta Metall. 39:1991;995-1002.
31. Nichols C.S., Cook R.F., Clarke D.R., Smith D.A. Alternative length scales for polycrystalline materials. I Microstructure evolution. Acta Metall. 39:1991;1657-1665.
32. Nichols C.S., Cook R.F., Clarke D.R., Smith D.A. Alternative length scales for polycrystalline materials. II Cluster morphology. Acta Metall. 39:1991;1666-1675.
33. Smith D.A. Ranganathan S, Pande C.S., Rath B.B., Smith D.A. Interfaces. 1993;87 Trans Tech Publications, Aedemannsdorf, Switzerland.
34. Jang H, Seidman D.N., Merkle K.L. Interface Sci. 1:1993;61.
35. Shashkov D.A. [PhD thesis]. 1997;Northwestern University, Evanston, Ilinois.
36. Güntherodt H-J, Wiesendanger R. Scanning Tunneling Microscopy. 1:1992;Springer Verlag, Heidelberg.
37. Kerssemakers J.W.J., De Hosson J.Th.M. A quantitative analysis of surface deformation by slick/slip atomic formation. J Appl Phys. 82:1997;3763-3770.
38. Oele W.F., Kerssemakers J.W.J., De Hosson J.Th.M. In situ generation and atomic scale imaging of slip traces with atomic force microscopy. Rev Sci Instrum. 68:1997;4492-4497.
39. Miller M.K., Cerezo A, Hetherington M.G., Smith G.D.W. Atom Probe Field Ion Microscopy. 1996;377 Oxford Science, Oxford.
40. Blavette D, Deconihout D, Bostel A, Sarrau JM, Bouet M, Menand A. The tomographic atom-probe - a quantitative 3-dimensional nanoanalytical instrument on an atomic-scale. Rev Sci Instrum. 64:1993;2911-2919.
41. Yu E.T., Pennycook S.J. MRS Bulletin. 22:1997;17-62.
42. Zernike F. Z Tech Phys. 16:1935;454.
43. Scherzer O. The theoretical resolution limit of the electron microscope. J Appl Phys. 20:1949;20-29.
44. Coene W, Janssen A, Op de Beeck M, van Dijk D. Phase retrieval through focus variation for ultra-resolution in field-emission transmission microscopy. Phys Rev Lett. 69:1992;3743-3746.
45. Lichte H. Adv Opt El Microsc. 12:1991;25.
46. Philipp F, Höschen R, Osaki M, Möbus G, Rühle M. New high-voltage atomic-resolution microscope approaching 1-angstrom point resolution installed in Stuttgart. Ultramicroscopy. 56:1994;1-10.
47. Wilbrandt P.J. A simple concept for better alignment and simplified operation of a transmission electron-microscope. Ultramicroscopy. 52:1993;193-204.
48. Krivanek O.L., Stadelmann P.A. Effects of 3-fold astigmatism on high-resolution electron-micrographs. Ultramicroscopy. 60:1995;103-113.
49. Cowley JM. Electron-microscopy of crystals with time-dependent pertubations. Acta Cryst A. 44:1988;847-853.
50. Krivanek O.L., Ahn CC, Wood G.J. The inelastic contribution to high-resolution images of defects. Ultramicroscopy. 33:1990;177-185.
51. Hÿtch M.J., Stobbs WM. Quantitative comparison of high-resolution TEM images with image simulations. Ultramicroscopy. 53:1994;191-203.
52. Möbus G, Rühle M. Structure determination of metal-ceramic interfaces by numerical contrast evaluation of HRTEM micrographs. Ultramicroscopy. 56:1994;54-70.
53. Merkle K.L. Quantification of atomic-scale grain-boundary parameters by high-resolution electron microscopy. Ultramicroscopy. 40:1992;281-290.
54. Wood G.J., Stobbs WM, Smith D.J. Methods for the measurement of rigid-body displacements at edge-on boundaries using HREM. Phil Mag A. 50:1986;375-391.
55. 3 interfaces. Acta Metall. 40:1992;S217-S225.
56. Trampert A, Ernst F, Flynn C.P., Fischmeister C.P., Rühle M. HRTEM studies of the Ag/MgO interface. Acta Metall. 40:1992;S227-S236.
57. Saxton W.O., Smith D.J. The determination of atomic positions in high-resolution electron micrographs. Ultramicroscopy. 18:1985;39-47.
58. Möbus G, Necker G, Rühle M. Adaptive Fourier-filtering technique for quantitative evaluation of high-resolution electron micrographs of interfaces. Ultramicroscopy. 49:1993;46-65.
59. Hofmann D, Ernst F. Quantitative high-resolution transmission electron microscopy of the incoherent Sigma-3(211) boundary in Cu. Ultramicroscopy. 53:1994;205-221.
60. De Hosson J.Th.M., van Tenderloo G, Schrijvers D. Amelinckx S, Dijck D, van Landuyt J, van Tenderloo G. Handbook of Microscopy. 1997;VCH-publisher, Weinheim.
61. Marks L.D., Smith D.J. Direct surface imaging in small metal particles. Nature. 303:1983;316-317.
62. Smith D.J., Marks L.D. Direct atomic imaging of solid-surfaces. 3. Small particles and extended Au surfaces. Ultramicroscopy. 16:1985;101-113.
63. Mills M.J., Daw M.S., Foiles SM. High-resolution transmission electron-microscopy studies of dislocation cores in metals and intermetallic compounds. Ultramicroscopy. 56:1994;79-93.
64. Penisson JM, Bourret A. High-resolution study of [100] low-angle tilt boundaries in aluminium. Phil Mag A. 40:1979;811-824.
65. deCrecy A, Bourret A, Naka S, Lasalmonie A. High-resolution determination of the core structure of 113〈1120〉{10 1 0} edge dislocation in titanium. Phil Mag A. 47:1983;245-254.
66. Luzzi D.E., Min Yan, Sob M, Vitek V. Atomic structure of a grain boundary in a metallic alloy: combined electron microscope and theoretical study. Phys Rev Lett. 67:1991;1894-1897.
67. Buckett MI, Merkle K.L. Determination of grain-boundary volume expansion by HREM. Ultramicroscopy. 56:1994;71-78.
68. Hetherington C.J.D., Dahmen U, O'Keefe M.A., Kilaas R, Turner J, Westmacott K.H., Mills M.J., Vitek V. Sinclair R, Smith D.J., Dahmen U. Mater Res Soc Symp. 183:1990;45.
69. Vellinga W.P., De Hosson J.Th.M., Vitek V. Misfit dislocations: an atomistic and elastic continuum approach. Acta Mater. 45:1997;1525-1534.
70. 4 precipitates and Ag studied with HRTEM. Mater Sci Forum. 361:1996;207-209.
71. 4 interfaces. Acta Mater. 45:1997;3587-3607.
72. Kooi B.J., Groen H.B., De Hosson J.Th.M. Acta Mater. 46:1998;1.
73. Pennycook S.J., Jesson D.E. High-resolution incoherent imaging of crystals. Phys Rev Lett. 64:1990;938-941.
74. Pennycook S.J., Jesson D.E. High-resolution Z-contrast imaging of crystals. Ultramicroscopy. 37:1991;14-38.
75. Pennycook S.J., Nellist P.D., Chisholm M.F., Browning N.D., Wallis D.J., Dickey EC. Smith D.J. Mater Res Soc Symp Proc. 466:1997;3.
76. Randle D.J., Randle V. Microtexture determination by electron back scattering diffusion. J Mater Sci. 27:1992;4545-4576.
77. Danilatos G.D. Review and outline of environmental SEM at present. J Microscopy. 162:1991;391-402.
78. Johnson R. Environmental Scanning Electron Microscopy. 1996;Phillips Electron Optics, Eindhoven, The Netherlands.
79. Goodhew P.J. Dyson B.F. Materials Metrology and Standards for Engineering Design. 1992;Elsevier, Amsterdam.
80. Goodhew P.J. Proceedings of the 10th European Congress on Electron Microscopy. Lopez-Galindo A, Rodrigez-Garciá MI. Electron Microscopy. 2:1992;211.
81. Chone J. International Symposium on Quantitative Metallography. 1978;209 Association Italiana di Metallurgica, Florence.
82. Laws M.S., Goodhew P.J. Grain boundary structure and Cr segregation in A316 stainless steel. Acta Metall. 39:1991;1525.
83. Bottom G.A., Humphreys C.J. Analysis of EELS and near edge structures to study the bonding character in intermetallic alloys. Micron. 28:1997;313.
84. Bottom G.A., Guo G.Y., Temmerman WM, Humphreys C.J. Experimental and theoretical study of the electronic structure of Fe, Co, and Ni aluminides with the B2 structure. Phys Rev B. 54:1996;1682.
85. Brown LM, Allen G, Flewitt. Nanochemistry of grain boundaries. Physics World. 1997;45.
86. Zandbergen H.W., Traeholt C. Small particles. Amelinckx S, van Dijck D, van Landuyt J, van Tenderloo G. Handbook of Microscopy. 1997;691 VCH, Weinheim.
87. Marks L.D. Experimental studies of studies of small particle structures. Rep Prog Phys. 57:1994;603.
88. Humphreys C.J. Electron microscopy and analysis: the future. Inst Phys Conf Ser No 153. 1997;31. Cambridge.