High-resolution X-ray diffraction and X-ray reflectivity studies of short-period CdTe/MnTe-superlattices

Journal of Crystal Growth

Volumn 184-185, Issue , 1998, Pages 105-108

  Stangl, J ^a   Darhuber, A A ^a   Holy V ^a   De Naurois, M ^a   Ferreira, S ^a   Faschinger, W ^a   Bauer, G ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Elastic properties; Interface roughness; Strained heterostructures; Vertical and lateral correlation

Indexed keywords

EID: 0004428276     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)80303-5     Document Type: Article

References (11)

1. M. de Naurois, J. Stangl, W. Faschinger, G. Bauer, S. Ferreira, J. Appl. Phys. 81 (1997) 6120.
2. P. Maheswaranathan, R.J. Sladek, U. Debska, Phys. Rev. B 31 (1985) 5212.
3. E. Janik, E. Dynowska, J. Bak-Misiuk, M. Leszcyński, W. Szuszkiewicz, T. Wojtowicz, G. Karczewski, A.K. Zakrzewski, J. Kossut, Thin Solid Films 267 (1995) 74.
4. S.K. Sinha, E.B. Sirota, S. Garoff, H.B. Stanley, Rev. B 38 (1988) 2297.
5. V. Holý, T. Baumbach, Phys. Rev. B 49 (1994) 10668.
6. A.L. Barabási, H.E. Stanley, Fractal Concepts In Surface Growth, Cambridge University Press, Cambridge, 1995, and references therein.
7. T. Salditt, D. Lett, T.H. Metzger, J. Peisl, G. Vignaud, P. Høghøj, O. Schärpf, P. Hinze, R. Lauer, Phys. Rev. B 54 (1996) 5860.
8. G. Palasantzas, J. Krim, Phys. Rev. B 48 (1993) 2873.
9. P.H. Jouneau, A. Tardot, G. Feuillet, H. Mariette, J. Cibert, J. Appl. Phys. 75 (1994) 7310.
10. J.M. Hartmann, G. Feuillet, M. Charleux, H. Mariette, J. Cibert, J. Appl. Phys. 79 (1995) 3035.
11. X.L. Zhou, S.H. Chen, Theoretical foundation of X-ray and neutron reflectometry, Phys. Reports 257 (1995) 223, and references therein.