Direct imaging of the spectral emission characteristic of an InGaN/GaN-ultraviolet light-emitting diode by highly spectrally and spatially resolved electroluminescence and photoluminescence microscopy

Applied Physics Letters

Volumn 75, Issue 22, 1999, Pages 3440-3442

  Fischer, Peter ^a   Christen, Jürgen ^a   Zacharias, Margit ^a   Schwegler, Veit ^b   Kirchner, Christoph ^b   Kamp, Markus ^b  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004096435     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125289     Document Type: Article

References (12)

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