HIGH RESOLUTION THERMAL MICROSCOPY.

Ultrasonics Symposium Proceedings

Volumn , Issue , 1986, Pages 393-397

  Williams, C C ^a   Wickramasinghe, H K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED IMAGING - APPLICATIONS;

HIGH RESOLUTION THERMAL MICROSCOPY; LOCAL TEMPERATURE MAPPING; SURFACE PROFILING; THERMAL FIELDS IMAGING;

MICROSCOPES;

EID: 0022954823     PISSN: 00905607     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ultsym.1986.198771     Document Type: Conference Paper

References (13)