Testing-Based Failure Analysis: A Critical Component of the SIA Roadmap Vision

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 1997-October, Issue , 1997, Pages 3-6

  Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL COMPONENT; ROADMAP;

FAILURE ANALYSIS;

EID: 0003804219     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa1997p0003     Document Type: Conference Paper

References (7)

1. "The National Technology Roadmap for Semiconductors" - Semiconductor Industry Association, 1994.
2. W. Maly, "Research Directions Relevant for Future of IC Design and Test", SRC Research Report No CMUCAD-97-17, (1997).
3. W. Maly, "The future of IC design, testing, and manufacturing", IEEE Design&Test of Computers, Winter 1996, pp. 8, 89-91.
4. W. Maly, H. T. Heineken, J. Khare, and P. K. Nag, "Design for Manufacturability in Submicron Domain, " Proc. of ICCAD 96, pp. 690-697.
5. 5 S. Wei, P.K. Nag, R.D. Blanton, A Gattiker and W. Maly, "DFT or Not To DFT ? ", To be published in Proc. of ITC-97.
6. P. K. Nag, "Yield Forecasting, " Ph.D. Thesis, Carnegie Mellon University, Apr. 1996.
7. P. K. Nag. W. Maly and H. Jacobs, "Simulation of yield/cost learning curves using Y4 ", IEEE Trans, on Semiconductor Manufacturing., Vol. 10, May 1997, pp. 256-266.