Frequency domain testing of ADCs

IEEE Design and Test of Computers

Volumn 13, Issue 1, 1996, Pages 64-69

  Mielke, Joseph A ^a  

^a Credence Systems Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DIGITAL CIRCUITS; DIGITAL SIGNAL PROCESSING; FAST FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; SIGNAL TO NOISE RATIO; SPECIFICATIONS; WAVEFORM ANALYSIS;

COHERENT SAMPLING; FREQUENCY DOMAIN TRANSFORMS; MIXED SIGNAL DEVICES;

ANALOG TO DIGITAL CONVERSION;

EID: 0030108831     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.485784     Document Type: Article

References (4)

1. High-Speed Design Seminar 1989 Analog Devices Mass., Norwood
2. M. Mahoney DSP-Based Testing of Analog and Mixed-Signal Circuits 1987 IEEE Computer Society Press Calif., Los Alamitos
3. R.W. Ramirez The FFT: Fundamentals and Concepts 1985 Prentice-Hall N.J., Englewood Cliffs
4. Analog-Digital Conversion Handbook 1986 Prentice-Hall N.J., Englewood Cliffs