A framework for reliability prediction during product development process incorporating engineering judgments

Quality Engineering

Volumn 15, Issue 4, 2003, Pages 649-662

  Yadav, Om Prakash ^a   Singh, Nanua ^a   Goel, Parveen S ^b   Itabashi Campbell, ^b  

^a Wayne State University   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

Bayesian framework; Engineering judgments; Fuzzy logic; Product development process; Reliability prediction; Weibull distribution

Indexed keywords

FUZZY SETS; PARAMETER ESTIMATION; RELIABILITY; STATISTICAL METHODS; WEIBULL DISTRIBUTION;

DEFECT-DRIVEN FAILURE MECHANISM;

PRODUCT DEVELOPMENT;

EID: 0003296279     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1081/QEN-120018396     Document Type: Article

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