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Volumn 65, Issue 2, 1999, Pages 95-101

Analysis of grouped data from field-failure reporting systems

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; FAILURE ANALYSIS; MATHEMATICAL MODELS; PRECISION ENGINEERING; RELIABILITY; SERVICE LIFE; WEIBULL DISTRIBUTION;

EID: 0032662088     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(98)00089-1     Document Type: Article
Times cited : (35)

References (10)
  • 2
    • 0030167876 scopus 로고    scopus 로고
    • Weibull component reliability-prediction in the presence of masked data
    • Usher J.S. Weibull component reliability-prediction in the presence of masked data. IEEE Transactions on Reliability. 45:1996;229-232.
    • (1996) IEEE Transactions on Reliability , vol.45 , pp. 229-232
    • Usher, J.S.1
  • 4
    • 0025867721 scopus 로고
    • Graphical analysis of ill-collected interval data for a repairable system in vehicles
    • IEEE. New York: IEEE, January
    • Wang CJ. Graphical analysis of ill-collected interval data for a repairable system in vehicles. In: Proceedings Annual Reliability and Maintainability Symposium (RAMS), IEEE. New York: IEEE, January 1991:93-97.
    • (1991) In: Proceedings Annual Reliability and Maintainability Symposium (RAMS) , pp. 93-97
    • Wang, C.J.1
  • 5
    • 0004065280 scopus 로고    scopus 로고
    • Reliability Analysis Center. RAC Report EPRD, Rome, NY
    • Reliability Analysis Center. Electronic parts reliability data. RAC Report EPRD, Rome, NY, 1997.
    • (1997) Electronic Parts Reliability Data


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.