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Volumn 66, Issue SUPPL. 1, 1998, Pages

Combined scanning tunneling and forcemicroscope with fuzzy controlled feedback

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE; FEED-BACK LOOP; FREQUENCY SHIFT; FUZZY LOGIC CONTROLLERS; NON-CONTACT; PI CONTROLLER; TUNNELING CURRENT; TUNNELING MICROSCOPES;

EID: 0003248753     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051098     Document Type: Article
Times cited : (5)

References (17)
  • 3
    • 0001585909 scopus 로고
    • Forces in scanning probe methods
    • D. Anselmetti, E. Meyer (Eds.), (Kluwer, Dordrecht)
    • H.-J. Güntherodt, D. Anselmetti, E. Meyer (Eds.): Forces in Scanning Probe Methods, NATO ASI Series E: Applied Sciences Vol. 286, (Kluwer, Dordrecht 1995)
    • (1995) NATO ASI Series E: Applied Sciences , vol.286
    • Güntherodt, H.-J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.