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Volumn 66, Issue SUPPL. 1, 1998, Pages
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Combined scanning tunneling and forcemicroscope with fuzzy controlled feedback
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Author keywords
[No Author keywords available]
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Indexed keywords
AFM;
ATOMIC FORCE;
FEED-BACK LOOP;
FREQUENCY SHIFT;
FUZZY LOGIC CONTROLLERS;
NON-CONTACT;
PI CONTROLLER;
TUNNELING CURRENT;
TUNNELING MICROSCOPES;
ATOMIC FORCE MICROSCOPY;
CONTROL SURFACES;
FUZZY SYSTEMS;
WIND TUNNELS;
FUZZY LOGIC;
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EID: 0003248753
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051098 Document Type: Article |
Times cited : (5)
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References (17)
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